When the master data is set up correctly, the OEE KPIs are calculated by SAP DM and become visible in the OEE overview perspective of the Line Monitor POD. The standard view is shown in the first image and a view with an image overly is visualized in the second image below. In the image, you can see two different overview pages of the OEE, both are on Work Center level and include the OEE KPI and the KPIs of Availability, Performance, and Quality. Those four KPIs are shown with a color schema (green for on track, yellow for warning, and red for critical) to indicate to the supervisor if everything is on track or if acting is required. The upper part of the image shows the standard view with the Work Centers as tiles while the lower part has an image overlay of the shop floor design (see Unit 4–Adding Image Overlay Tools for more details). You can toggle between both if you have an image overlay configured.
From both overview pages, you can open the same detail page by choosing one of the blue-marked areas. If you do so, the detailed OEE view like in the third image opens. This view supports the supervisor to do root cause analysis and identify losses. The losses can be of the type Availability, Performance, or Quality and are categorized by either a reason (Reason Code) or can be marked as untagged losses. The top five reasons for losses are listed for each OEE component and include the amount of time they have caused by day/shift. If losses were not logged during the production process and are considered as untagged losses, they can be turned to losses with Reason Codes by the operator using the "Downtime" (for Availability) and the "Speed Loss List" (for Performance) plugin in the POD.
The OEE can also be analyzed over a longer period of time than only shifts or days as it is in the Line Monitor POD. It can be done in the Embedded Analytics Cloud (eSAC) with the OEE MDO.
